2D-Materials

What is unique about an imaging ellipsometer?

• Spectroscopic ellipsometric measurements on flakes of 2D-materials with sizes down to 1µm

• Microscopic maps of thickness distribution and refractive indices from 190-1700nm

• Ellipsometric contrast micrographs (ECM) enable increased contrast imaging over e.g. optical microscopy to visualize layer numbers and inhomogeneities

• Non-destructive measurements on transparent substrates using knife edge illumination to prevent unwanted backside reflections

Brochure

Key Features

Imaging spectroscopic ellipsometry can be applied to characterize graphene and other 2D-materials. CVD grown, exfoliated and epitaxially grown flakes of 2D-materials are analyzed with the imaging ellipsometer ep4.

Imaging of monolayers on different substrates
Determination of the optical dispersion
Distinction between mono-, bi- or n-layers
Automatic flakesearch algorithm for identification of monolayers or well-defined thickness regions
Exploration of heterostructures
Quality control by detecting defects and special aspects of 2D nanoplates

Compendium: Graphene and 2D-Materials

Beyond Graphene_Microscopic Characterization of 2D Materials by SIE

Characterisation of 2D Materials by SIE and RSE

Imaging Ellipsometry as a Tool for Characterization of 2D Materials on Various Substrates

Full scale wafer analysis by imaging ellipsometry and ellipsometric contrast micrography

Spectroscopic Ellipsometry and Optical Constants of MoS2 Flakes

Imaging Mueller Matrix Ellipsometry for Anisotropic Samples of Black Phosphorus

Characterization of Graphene through Imaging Spectroscopic Ellipsometry

Graphene on Cu

MoS₂-WSe₂ Investigated by Imaging Ellipsometry

Automatic Localization of Mono- to N-Layers 2D Materials by Spectroscopic Imaging Ellipsometry

Voltage-Controlled Dielectric Function of Bilayer Graphene (2020)

Giant Optical Anisotropy in Transition Metal Dichalcogenides for Next-Generation Photonics (2020)

Fast, Noncontact, Wafer-Scale, Atomic Layer Resolved Imaging of Two-Dimensional Materials by Ellipsometric Contrast Micrography (2018)

Manifold Coupling Mechanisms of Transition Metal Dichalcogenides to Plasmic Gold Nanoparticle Arrays (2018)

Imaging Spectroscopic Ellipsometry of MoS2 (2016)

Spectroscopic Imaging Ellipsometry for Automated Search of Flakes of Mono- and N-Layers of 2D Materials (2016)

Spectroscopic Imaging Ellipsometry and Fano Resonance Modeling of Graphene (2012)

High Resolution Imaging of Few-Layer Graphene (2012)

Imaging Ellipsometry of Graphene (2010)

Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry (2008)

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Ellipsometer

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