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Electrical Modes

For engineers and researchers that need accurate data on conductance, sample resistance, and other electrical and topographic properties, Park offers a range of electrical scanning modes.

PinPoint™ AFM Nanoelectrical Modes

eliminate lateral shear forces between the cantilever tip and the surface

Conductive AFM (C-AFM)

Probing the Local Electronic Structure of a Sample’s Surface

IV Spectroscopy

IV spectroscopy is measured on the selected sample area after taking a sample image

Electrostatic Force Microscopy (EFM)

High Resolution and High Sensitivity Imaging of Electrostatic Force

Kelvin Probe Force Microscopy (KPFM)

High Resolution and High Sensitivity Imaging of Surface Potential

Dynamic Contact EFM (DC-EFM)

High Resolution and High Sensitivity Imaging of Electrostatic Force

Piezoresponse Force Microscopy (PFM)

electromechanical material properties on the nanometer scale in addition to the sample topography

Piezoresponse Force Spectroscopy

Local amplitude/phase response to a DC bias between tip and sample surface.

QuickStep™ SCM

QuickStep™ to make faster SCM data acquisition

Scanning Capacitance Microscopy (SCM)

High Resolution and High Sensitivity Imaging of Charge Distribution

Scanning Spreading Resistance Microscopy (SSRM)

Probing the Local Electronic Structure of a Sample’s Surface

Scanning Tunneling Microscopy (STM)

Probing the Local Electronic Structure of a Sample’s Surface

Photo Current Mapping (PCM)

Enabling Innovation in Photosensitive Materials Research