Park AFMs feature the ability to conduct current voltage spectroscopy on specified point of the sample surface. The low noise of Park Systems’ conductive AFM options allows for the detection of extremely small changes in a sample’s electronic characteristics.
SRAM
Scan size:2 µm
Using Probe: CDT-ContR
Imaged on a Park NX10 using I-V Spectroscopy Mode.
Using a cantilever as a nanometer scale contact, IV spectroscopy provides a plot of the current (I) as a function of the tip bias voltage (V) applied to a sample. In order to investigate the electrical properties of the sample surface, IV spectroscopy is measured on the selected sample area after taking a sample image.