이미징 분광 엘립소미터
Park Systems' Imaging Ellipsometers combine the benefits of ellipsometry and optical microscopy in a single device.
참조 분광 엘립소미터
The Referenced Spectroscopic Ellipsometer (RSE) offers rapid thickness mapping for quality control.
브루스터 각 현미경
Brewster Angle Microscopy technique observes ultrathin organic films on transparent substrates using Brewster angle, enhancing detection for high-contrast imaging.
엘립소미터 부속품
Park Systems provides a wide range of accessories for imaging ellipsometry.