Displays Imaging Ellipsometry • Spectroscopic measurements on few micron small regions, using patented ROI (Region Of Interest) concept • Each ROI (Region Of Interest) corresponds to another layer stack ⇒ Multiple measurements in a single run • Coupling thicknesses between different models allows uncorrelating the results of multi layer films • UV wavelength range down to 190nm to characterize display materials • Multiple results from a single measurement: Thicknesses, optical dispersions, compositions • Pattented RCE6 mode allows tact times of < 20s Brochure × ×
Displays Imaging Ellipsometry • Spectroscopic measurements on few micron small regions, using patented ROI (Region Of Interest) concept • Each ROI (Region Of Interest) corresponds to another layer stack ⇒ Multiple measurements in a single run • Coupling thicknesses between different models allows uncorrelating the results of multi layer films • UV wavelength range down to 190nm to characterize display materials • Multiple results from a single measurement: Thicknesses, optical dispersions, compositions • Pattented RCE6 mode allows tact times of < 20s Brochure × ×
