スペシャルモード パーク・システムズは、最も革新的なイメージングモードと技術を提供しています。弊社の真のノンコンタクト™モードは、世界で唯一の完全に非接触のAFMスキャンモードであり、標準のスキャニングモードでも最も正確なスキャンが可能です。
EC-AFM In-situ imaging of electrochemical reactions in liquid environments Learn More Magnetic Force Microscopy (MFM) Magnetic properties imaging by sensing magnetic forces between a magnetized AFM tip oscillating above the sample surface Learn More Photo-induced Force Microscopy (PiFM) Chemical and compositional nano-imaging by detecting photothermal-induced tip–sample forces at specific infrared absorption frequencies Learn More Scanning Electrochemical Cell Microscopy (SECCM) Localized electrochemical characterization employing a nanopipette as an electrochemical cell to map chemical reactivity Learn More Scanning Ion Conductance Microscopy (SICM) Non-contact topographical imaging using a nanopipette to measure ion current changes, mapping surface structure via ion conductance feedback without physical contact Learn More Scanning Ion Conductance Microscopy-Scanning Electrochemical Microscopy (SICM-SECM) Combines SICM with SECM for simultaneous surface topography and electrochemical activity imaging Learn More Scanning Thermal Microscopy (SThM) Thermal conductivity and temperature distribution imaging at the nanoscale using a nanothermal probe Learn More
EC-AFM In-situ imaging of electrochemical reactions in liquid environments Learn More Magnetic Force Microscopy (MFM) Magnetic properties imaging by sensing magnetic forces between a magnetized AFM tip oscillating above the sample surface Learn More Photo-induced Force Microscopy (PiFM) Chemical and compositional nano-imaging by detecting photothermal-induced tip–sample forces at specific infrared absorption frequencies Learn More Scanning Electrochemical Cell Microscopy (SECCM) Localized electrochemical characterization employing a nanopipette as an electrochemical cell to map chemical reactivity Learn More Scanning Ion Conductance Microscopy (SICM) Non-contact topographical imaging using a nanopipette to measure ion current changes, mapping surface structure via ion conductance feedback without physical contact Learn More Scanning Ion Conductance Microscopy-Scanning Electrochemical Microscopy (SICM-SECM) Combines SICM with SECM for simultaneous surface topography and electrochemical activity imaging Learn More Scanning Thermal Microscopy (SThM) Thermal conductivity and temperature distribution imaging at the nanoscale using a nanothermal probe Learn More