
Electrical Modes
Park Fast PinPoint™
Revolutionizing AFM Imaging for High-Speed Nanomechanical Property Mapping with Accurate Material Characterization
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Revolutionizing AFM Imaging for High-Speed Nanomechanical Property Mapping with Accurate Material Characterization
Quantitative analysis of elastic modulus, adhesion, and stiffness at a fraction of the time compared to conventional methods.
Designed for polymers, composites, biological materials, semiconductors, and more.
Force-distance (F/d) curves are acquired at every contact point, ensuring comprehensive mechanical characterization.
Enables dynamic mechanical characterization, essential for materials with frequency-dependent properties.
Minimizes lateral forces for enhanced accuracy, making it suitable for delicate and sensitive samples.
PinPoint | Fast PinPoint | |
---|---|---|
Acquired Data | Topography, Modulus, Adhesion, Stiffness, Energy dissipation, Deformation | Topography, Modulus, Adhesion, Stiffness, Energy dissipation, Deformation |
Z Modulation frequency | <100 Hz | 100 Hz to 2 kHz |
Acquired Time | ~16 min for 128 × 128 pixels | ~2 min for 128 × 128 pixels |
Z Scanner Parameter | Z Scanner's movement distance (µm) Z Scanner's movement speed (µm/s) | Amplitude (nm) or Driving Voltage (V) Frequency (Hz) |