Explore Park Systems' AFM technology anytime, anywhere. Experience real scan scenarios and results without hardware or delays. Instant, interactive, and hassle-free — see what’s possible today.
*SmartSimulator is not the actual Park AFM software, but a simplified simulation that offers a minimized experience of Park Systems’ metrology solutions.
Park nano-IR is an integrated infrared (IR) spectroscopy and atomic force microscopy (AFM) system. The spectroscopy part provides chemical identification under 5 nm spatial resolution. It uses a non-contact technique offering the safest spectroscopy scanning and the best in industry spatial resolution. The microscopy part provides nanometer 3D topography with sub-angstrom height accuracy and mechanical property information to the user.
The FX200 is the latest large-sample Atomic Force Microscope (AFM) designed to enhance nanoscale surface analysis with advanced automation. This technical note provides a detailed overview of its key features, automation capabilities, improved sample navigation, StepScan technology, and experimental management system.
