Imaging Spectroscopic Ellipsometry
Park Systems' Imaging Ellipsometers combine the benefits of ellipsometry and optical microscopy in a single device.
Referenced Spectroscopic Ellipsometry
The Referenced Spectroscopic Ellipsometer (RSE) offers rapid thickness mapping for quality control.
Brewster Angle Microscopy
Brewster Angle Microscopy technique observes ultrathin organic films on transparent substrates using Brewster angle, enhancing detection for high-contrast imaging.
Accessories
Park Systems provides a wide range of accessories for imaging ellipsometry.