Park FX40 IR
The most advanced AFM with IR spectroscopy for small samples
Park FX40 IR is Park Systems’ advanced AFM solution for nanoscale infrared spectroscopy and imaging, combining chemical and surface characterization. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability.
FX40 IR supports Photo-induced Force Microscopy (PiFM), enabling both IR spectral analysis and chemical imaging at the nanoscale.
Like all Park AFMs, it features an orthogonal scan system and True Non-Contact™ Mode, delivering consistent, non-invasive measurements even on fragile samples.
Automation features such as automatic probe exchange, IR beam alignment, and multi-point measurement streamline operation and simplify workflows.
Key Features
By combining high-performance AFM with advanced IR capability, FX40 IR provides a powerful platform for precise and efficient nanoscale chemical characterization. Since the FX40 IR combines the Park FX40 and Park AFM-IR Spectrometers, explore each product’s core features on dedicated pages.
