Magnetic Mode
Park FM-MFM
High-Resolution, High-Sensitivity Magnetic Imaging via Frequency Modulation
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What is FM-MFM?
Frequency Modulation Magnetic Force Microscopy (FM-MFM) is an advanced AFM-based technique that measures magnetic forces with exceptional resolution and sensitivity. Unlike conventional amplitude modulation method (AM-MFM), FM-MFM detects frequency shifts in real-time using a Phase-Locked-Loop (PLL), allowing for artifact-free imaging and improved signal clarity
Park FM-MFM employs true frequency modulation, offering improved signal stability and reduced sensitivity to topographical artifacts compared to conventional MFM techniques. Many competing systems rely on amplitude-based detection, which can introduce higher noise levels and limit resolution at lower lift heights. By leveraging a high signal-to-noise ratio and optimized lift height control, Park FM-MFM enables researchers to achieve clearer, more reliable magnetic domain imaging with minimal setup adjustments.
Sharper, high-contrast images with minimal artifacts
Better noise reduction for more reliable interpretation
A powerful tool for nanomagnetic research breakthroughs
Key Features
Higher Sensitivity
FM-MFM minimizes topography-induced artifacts, ensuring true magnetic domain visualization.
Enhanced Data Reliability
Real-time frequency tracking via PLL ensures consistent and reproducible measurements.
Higher Resolution
Measures at a lower lift height (10 nm vs. 30 nm in AM-MFM), enhancing spatial resolution.
Ease of Use
Park FM-MFM integrates seamlessly into AFM workflows, making high-resolution magnetic imaging accessible to all researchers.
Superior Signal-to-Noise Ratio
Frequency modulation provides cleaner, more accurate data compared to amplitude-based detection.
Why Choose FM-MFM Over AM-MFM?
FM-MFM delivers a clearer, more precise view of magnetic domain structures at the nanoscale, giving you confidence in your data.
Amplitude modulation for 1st scan
Amplitude modulation for 2nd scan
Amplitude modulation for 2nd scan
Amplitude modulation for 1st scan
Frequency modulation for 2nd scan
Frequency modulation for 2nd scan
Feature Comparison
| Feature | AM-MFM | FM-MFM |
|---|---|---|
| Resolution | Lower | Higher |
| Artifacts | More topography-induced noise | Minimized |
| Lift Height | 30 nm | 10 nm |
| Signal Quality | Amplitude-based (prone to noise) | Frequency-based (higher SNR data) |
What Applications Can Be Measured?
Polymer
Material Science
Memory Device
Bio-Magnetic Materials