Park AFM Accessories
To make sure you can conduct more varied and specific research and tests, Park offers an array of additional accessories to further customize your AFM.
To make sure you can conduct more varied and specific research and tests, Park offers an array of additional accessories to further customize your AFM.
Access all the input/output signals for your AFM with the Signal Access Module. The unit provides an easy way to get scanner position, cantilever deflection, driving signal, bias, and other data to use to improve the quality of your work.
Supporting base for a system utilization without inverted microscope.
This accessory provides an applied external bias of up to +/-300V.
The magnetic field generator lets you apply an external magnetic field to the sample. The field can be changed from -300 gauss to 300 gauss, and is parallel to the sample surface. You can then easily observe changes in the magnetic structure using one of our magnetic force microscopy (MFM) options.
Our chip carriers come in several types depending on your needs. We currently offer:
Ideal for taking delicate MFM measurements, the non-magnetic sample holder prevents interference from the magnetic field of the standard sample holder.